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IPCAssociation
Connecting Electronics Industries and JEDECthe Solid State
Technology Association is sponsoring the 4th International Conference
on Lead- Free Electronic Components and Assemblies, October 2022,
2003 at the Hotel InterContinental Frankfurt, Frankfurt, Germany.
The European Union has
officially designated 1 July 2006 as the date that the Directive
on the Restriction of Hazardous Substances in Electrical and Electronic
Equipment will require the majority of electronic products sold
in Europe to be lead free.
Global public and political
pressure against lead continues to grow. International OEMs are
becoming more sensitive to the issue and continue to press their
suppliers to develop phase-out plans. The European ban is having
an effect in the global marketplace, forcing all manufacturers to
consider lead elimination. Manufacturers in all regions, will need
to prepare for this change. Companies not directly affected by the
legislation, in exempted markets, still need to be monitoring this
issue to assess the effects of changes in the supply chain and customer
demand.
Many challenges still
exist and the path forward to success is not one of consensus yet.
Companies need to stay aware of the hot issues. By attending the
4th International Conference on Lead Free, IPC and JEDEC want to
keep you and your company up to speed on the progress of no-lead
in electronic products. IPC and JEDEC have organized both full day
tutorials as well as a very strong technical conference with speakers
from all over the world. Your participation by attending a tutorial
or the technical conference will help your company achieve successful
change by 2006.
Sponsorship
Opportunities
A limited number of sponsorship opportunities
are available at the IPC/JEDEC conference. If your company is
interested
please contact Jean Hebeisen at hebeje@ipc.org as soon as possible. Click
here to download the sponsorship
application (pdf).
Tabletop
Exhibits
If you are interested in a tabletop exhibit,
please contact Jean Hebeisen at 847-790-5338 or
at hebeje@ipc.org. Click
here to download the tabletop
application (pdf)
Location
and Hotel Information
Both the tutorials and technical conference will be held at the
Hotel InterContinental Frankfurt, Wilhelm-Leuschner-Str. 43, 60329
Frankfurt am Main, Germany. Rooms are available at the hotel for
a special IPC/JEDEC room rate of €165/single occupancy (includes
breakfast), (approximately $182 US) per night and €175/double
occupancy (approximately $192 US) (includes breakfast) per night.
The GROUP Code is:
Lead Free/JEDEC. For reservations, please contact the hotel
at +49 69 2605 2339 or www.frankfurt.intercontinental.com.
Rooms
and rate are subject to availability after September 19, 2003,
so
please make your reservations early.
Registration
Information
All educational course registrants will receive course materials,
refreshments and lunch. All conference registrants will receive
conference proceedings (hard copy & CD ROM), refreshments and
lunch on both days. Please register by September 30, 2003. For more
information, or if the registration deadline has passed, please
contact IPCs registration department at 001-847-790-5361 or
e-mail registration@ipc.org. Cancellations Policy: Cancellations
receive by October 17, 2003 will be refunded in full. Refunds will
not be issued after the start of the program. Individuals failing
to cancel will be billed for the registration fee. If events are
cancelled, participants will receive a full refund. If you are unable
to attend, you may send a colleague in your place.
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| Professional
Development Courses |
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T-01:
A Practical Guide to Lead Free Assembly & Solder Master Class
Bob Willis
Electronic Presentation Services
October 20, 2003
8:30 am4:30 pm
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This course will provide
a practical guide to printed board assembly and introduce alternative
lead free materials. Case studies of companies eliminating lead
will be provided, along with the cost and environmental savings
to be made. Each participant will take away a comprehensive handbook
and an interactive CD on "Lead Free Soldering and Assembly"
produced by Bob Willis and National Physics Laboratory, England
worth over $150.
Attendees will be given
an insight into the current position in Japan. Examples of the types
of equipment and modifications to the soldering process will be
discussed, as well as answers to the following questions:
- Will existing wave
and reflow soldering systems cope?
- What are the technical
issues relating to reflow soldering?
- Can components meet
higher process temperatures?
- What design changes
are necessary?
- Will the solder joints
look different?
- What are the new soldering
or reliability problems?
- What new process defects
will be seen?
Who
Will Benefit
This course is ideal for those engineers who have to look at the
practical production issues associated with lead free soldering
and assembly. Quality engineers responsible for analyzing the defects
which have been seen with introducing higher process temperature
in assembly will also benefit from this course. Technical sales
engineers will be given an insight on practical issues in manufacture
and how to solve them with customers.
About
the Instructor
Specializing in SMT implementation, Bob Willis currently operates
Electronic Presentation Services, an England-based training and
consultancy business for the electronic manufacturing industry.
He has worked with the GEC Technical Directorate as Surface Mount
Coordinator for both the Marconi and GEC group of companies. Previously,
he was Senior Process Control Engineer with Marconi Communication
Systems.
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T-02:
Understanding of J-STD-020B and 033A Classification
and Handling of Moisture-Sensitive ICs
Dr. Richard Shook
Agere Systems
October 20, 2003
8:30 am 4:30 pm
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Higher reflow temperatures
required for lead free soldering seem are coming. Most popular alloys
currently being considered as "main stream" will require
processing temperatures significantly above the alloys that have
been used for years by the industry. This higher temperature will
have a significant impact on the component manufacturers qualification
needs, as well as the assemblers manufacturing process. One
significant concern is the moisture sensitivity of many electronic
components. IPC and JEDEC have developed two standards that address
component issues. These documents are directly impacted by the lead
free change.
Attendees will be provided
insight into the IPC/JEDEC specification, the logic behind the requirements
and the pending impacts including:
- An overview of the
IPC/JEDEC moisture/reflow classification tests and their evolutionary
background history.
- Moisture/reflow classification
level determination for moisture-sensitive nonhermetic solid state
surface mount devices (SMDs).
- Details of the new
Pb-free reflow performance criteria.
- Overview of proper
shipping and handling procedures for achieving safe and damage-free
reflow assembly.
- Recommended baking
procedures and details on extended storage using moisture "derating".
- Shelf life and dry-bag
sealing requirements.
- Information and technical
background details will also be discussed covering topics such
as:
- Equivalent accelerated
moisture exposure
- Proper low-humidity
containment and baking procedures
- Moisture "derating"
tables
- Desiccant science.
Who
Will Benefit
Component manufacturers that want to expand their working knowledge
of the IPC/JEDEC specifications. OEMs and EMS companies that want
to understand the impact of higher processing temperatures on the
components they use, as well as the process they use to assemble
them. Material/consumable suppliers that want to understand the
rating process and how it translates to requirements on the shop
floor, will also benefit from this course.
About
the Instructor
Rick Shook is currently a Consulting Member of Technical
Staff at Agere Systems in Allentown, Pennsylvania where he is responsible
for IC package development and reliability assessment. Rick has
published extensively on the topic of moisture/reflow sensitivity
and received an outstanding paper award at the 49th ECTC for his
paper on "Handling of Highly-Moisture Sensitive Components
An Analysis of Low-Humidity Containment and Baking Schedules."
He has been directly involved with US industry standardization for
moisture/reflow testing through active participation on JEDEC and
IPC committees. Some of Ricks technical contributions have
been the development of the accelerated 60C/60%RH test criteria
along with the addition of moisture Level 2a incorporated in the
joint JEDEC/IPC moisture sensitivity specification J-STD-020, and
the development of the moisture derating and baking procedures adopted
in the JEDEC handling specification J-STD-033.
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T-03:
Lead Free Solder Joint Reliability
Jean-Paul Clech
EPSI Inc.
October 20, 2003
8:30am4:30pm
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Solder joint reliability
issues are on the critical path of lead free and mixed alloy product
introduction. The problem is compounded by limited field experience,
and, at times, contradictory test results. It is thus critical to
gain both a fundamental and a practical understanding of what factors
affect the long term reliability of lead free and mixed solder assemblies.
This workshop provides
a broad coverage and a synthesis of the latest reliability information
for popular lead free alloys such as Sn-Ag-Cu. The performance of
lead free and mixed assemblies is put in perspective with that of
Sn-Pb assemblies. Material properties and fatigue curves are presented,
that explain differences in the reliability of and in the acceleration
factors for SnPb and lead-free assemblies. Built upon an extensive
collection of and a quantitative analysis of multi-sourced lead
free reliability data, this workshop provides the necessary background
and the basis for assessing the reliability risks associated with
the introduction of lead-free solders in circuit board assemblies.
Topics
to be Covered
- Material properties,
incl. physical properties, creep data, cooling rate and composition
effects: Sn-Ag, Sn-Ag-Cu
- Fatigue curves, failure
modes.
- Failure distributions
(shape parameters for lead-free vs. SnPb assemblies)
- Thermal cycling reliability
data: 100% lead-free data (Sn-Ag-Cu), mixed assemblies (SnPb balls
+ lead-free paste; SAC balls + HASL); data for leadless components
(LCCC, discretes), leaded packages (TSOP, QFP), BGA (PBGA, CCGA,
CBGA), CSPs, Flip-Chip with & without underfill.
- Impact of components
and test conditions on rank-ordering of lead-free and SnPb assembly
reliability.
- Effect of component
and board finish on lead-free solder joint life (thermal cycling
& drop test).
- On-going developments:
acceleration factors, constitutive models, life prediction models.
Who
Will Benefit
Circuit board designers, packaging engineers, design,
manufacturing, quality or reliability professionals and managers
who are responsible for planning or implementing lead free assembly
technologies in their companies products.
About
the Instructor
Jean-Paul Clech has 18 years of practical experience in SMT quality
and reliability assurance. He maintains one of the largest databases
of solder joint reliability failures in the industry and is constantly
challenged by problems brought about by new and emerging technologies.
His current research interests are in BGA, CSP, flip-chip and lead-free
assembly reliability. Jean-Paul is the founder of EPSI Inc. in Montclair,
NJ. His responsibilities include technical consultation and problem
solving for clients across the electronics industry and the development
of engineering tools and training programs to prevent or solve reliability
problems in electronics packaging and assembly.
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| Conference
Agenda |
| Session
1October 21 |
*Session
2October 22 |
*Session
3October 22 |
| *
Runs concurrently |
| 8:30
am |
Registration
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9:00
am
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Implementing
Lead Free Assembly at your factory
Ron Lasky, Indium Corporation |
9:00
am |
Lead
Free and Halogen Free Products Requirements, Solutions
and Roadmap of a IC-Component Manufacturer
Klaus Burger, Atmel Germany GmbH |
9:00
am |
Pure
TinThe Finish of Choice for Connectors
Pete Elmgren, Molex
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| 9:30
am |
The
Transition to Lead Free Products in North America
Carol Handwerker,
NIST |
9:30
am |
Challenges
in Manufacturing Reliable Lead Free Component
Bruce Euzent, Altera Corporation |
9:30
am |
Pure
Tin Plated Leads Problems and Mitigation
J.S. Zaccari, Corfin Industries LLC |
| 10:00
am |
NEMI
Lead Free Solder Projects: Key Results and New Directions
Carol Handwerker, NIST |
10:00
am |
National
Semiconductor's Approach to Lead Free IC Assembly Transitioning
Martin Schnepf, National Semiconductor GmbH |
10:00
am |
Next
generation Organic Solderability Preservatives (OSP) for Lead
Free Soldering and Mixed Metal Finish PCBs and BGA Substrates
Koji Saeki, Shikoku Chemicals Corp. |
| 10:30
am |
Compatibility
will replace Global Lead-Free Roadmaps
Juergen Winterer,
Infineon |
10:30
am |
Lead
Free Components in Automotive Applications
Robert D. Hilty, Ph.D., P.E. Tyco Electronics |
10:30
am |
Chemical
Physical Characterization of finishes for copper surfaces in
Sn-Pb and Sn-Ag-Cu joints
Lorenza Lombardi, Celestica |
| 11:00
am |
Harsh
Environment Applications for Lead Free Solder Systems
Steve Brown,
Cookson Electronics |
11:00
am |
Is
Component Ready for Lead Free Conversion?
Jeffrey Lee, Advanced Semiconductor Engineering, Inc. |
11:00
am |
An
Alternative Lead Free finish for Leadframe-Based Packages in
a Fully
Bo Chang & Carl Gamboa, Cypress Semiconductor |
| 11:30
am |
HALT
(Highly Accelerated Life Test) Strategies for Lead Free Soldering
Phil Conde & Howell Schwartz, Dell, Inc. |
11:30
am |
Lead
Free Profiling of Complex Assembly (with 020B in mind)
Quyen Chu, Jabil |
11:30
am |
Lead
Free Tin-Alloy Plating for Mass-Production
Manfred Jordan, Dr.-Ing. Max Schlotter |
| 12:00
pm |
Lunch |
12:00
pm |
Lunch |
12:00
pm |
Lunch |
| 1:00
pm |
A
Reliability Examination Using Lead Free Solder in Accordance
with Military Test Profiles
Todd Treichel, Precision Device, Inc. |
1:00
pm |
Lead
Free Assembly of Complex Modules: Technological and Logistical
Challenges
Dr. Hans-Juergen Michel, Siemens AG ICN |
1:00
pm |
Investigation
of the Recommended Immersion Tin Thickness for Lead Free Soldering
Sven Lamprecht, Atotech Deutschland GmbH |
| 1:30
pm |
Lead
Free Fine Ball Grid Array (FBGA) and Its Thermal Effects at
260°C Reflow
Alvin Denoyo, Cypress Manufacturing Limited |
1:30
pm |
A
Mechanical Model of Flexible Printed Circuits for the Surface
Mount Assembly
Mikko Hanalainen, Elecoteq Network Corp. |
1:30
pm |
Do
We Know Enough About Lead Free Solders
Milos Dusek & Christopher Hunt, National Physical Lab |
| 2:00
pm |
Influence
of the Addition of Gold on the Properties of Tin-Antimony Lead
Free Solder
Dennis Prem Kumar Chandran, Intel Technology |
2:00
pm |
Effects
of Process Parameters on the Morphology of Interfacial IMC of
Lead Free Joints
Wu Fengshun, Huazhong University of Science and Technology |
2:00
pm |
Electronic
Materials Assay
Song Wei, Beijing Center for Physical and Chemical Analysis |
| 2:30
pm |
Whisker
Evaluation of Tin-Plated SMT Components
Lucy Hu, Integrated Device Technology |
2:30
pm |
Hand
Soldering and Rework of Lead Free Alloys
Simon Hawkins, OK International |
2:30
pm |
A
Comparison of Tin-Silver-Copper Lead Free Solder Alloys
Karl Seelig & David Suraski, AIM |
| 3:00
pm |
The
Effect of Temperature Cycling on Tin Whisker Formation
Marc Dittes, Infineon Technologies |
3:00
pm |
Through-Hole
Reflow THRAn Alternative Production Process in a Lead
Free World
Hahn-Barth Jurgen, Phoenix Contact GmbH |
3:00
pm |
57Bi-42Sn-1Ag:
A Lead Free, Low Temperature Solder for the Electronic Industry
Ernesto Ferrer & Helen Holder, Hewlett Packard |
| 3:30
pm |
Thermo-Mechanical
Characterization of Lead Free tin Plating: X-Ray Diffraction
Measurements and Correlation with Analytical and Numerical Models
Satbir Madra, WJ Communications, Inc. |
3:30
pm |
Lead
Free Wave Soldering Under Low Temperatures
Friedrich Juergen, ERSA GmbH |
3:30
pm |
The
Metallurgical Effect of Ag,, Sb & Cu on the Intermetallic
Phases Formations of a Sn Based Lead Free Soft Solder for 1st
Level Interconnect Application
Bryan Ong You Yang, ChipPac Sdn. Bhd. |
| 4:00
pm |
Roll
of Grain-Boundary Free Energy & Surface Free Energy for
Tin Whisker Growth
Kiyotaka Tsuji, Ishihara Chemical Co. |
4:00
pm |
Low
Temperature, High-Reliability Assembly of Lead Free CSPs
Tom Gregorich,Qualcomm CDMA Technologies |
4:00
pm |
Improving
Oxide Resistance and Solderability of Electroplated Tin &
Tin Alloy Coatings
Rob Schetty, Technic Inc. |
| 4:30
pm |
Adjourn |
4:30
pm |
Development
of a Lead Free Surface Mount Process for High Complexity Electronic
Assemblies
Eddie N. Hernández HP |
4:30
pm |
3D
Inspection for no-lead Paste
Doreen Tan (GSI Lumonics) |
| 4:45
pm |
Networking
Reception |
5:00
pm |
Adjourn |
5:00
pm |
Adjourn |
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Lead
Free Electronic Components and Assemblies Registration Form
(If you would prefer to view this as a pdf document click here.
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IPC/JEDEC Member |
Non-Member |
Super
Package (includes conference and one tutorial)
Please circle
desired course T-01
T-02 T-03 |
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| Conference-Only |
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(U.S.) |
$750
(U.S.) |
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Course Only
Please circle desired course T-01
T-02
T-03
|
$450 (U.S.) |
$650
(U.S.) |
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send $_________________________via wire transfer to Bank One,
Chicago, Illinois 60690, SWIFT code FNBCUS44, (Acct Name) IPC-Depository
Account, (Acct#) 0018231861, (ABA Routing #) 071000013 |
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Please check here
if you have a disability requiring accommodation and call 847-790-5361
to discuss your needs. |
*To
register by mail: IPC, Dept. 77-3491, Chicago, IL 60678-3491
or by fax: 847-509-9798. Please call 847-790-5361 if you have questions. |
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